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87590e26 KP |
1 | /* |
2 | * linux/include/linux/mtd/bbm.h | |
3 | * | |
4 | * NAND family Bad Block Management (BBM) header file | |
5 | * - Bad Block Table (BBT) implementation | |
6 | * | |
a1452a37 | 7 | * Copyright © 2005 Samsung Electronics |
87590e26 KP |
8 | * Kyungmin Park <kyungmin.park@samsung.com> |
9 | * | |
a1452a37 | 10 | * Copyright © 2000-2005 |
87590e26 KP |
11 | * Thomas Gleixner <tglx@linuxtronix.de> |
12 | * | |
a1452a37 DW |
13 | * This program is free software; you can redistribute it and/or modify |
14 | * it under the terms of the GNU General Public License as published by | |
15 | * the Free Software Foundation; either version 2 of the License, or | |
16 | * (at your option) any later version. | |
17 | * | |
18 | * This program is distributed in the hope that it will be useful, | |
19 | * but WITHOUT ANY WARRANTY; without even the implied warranty of | |
20 | * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the | |
21 | * GNU General Public License for more details. | |
22 | * | |
23 | * You should have received a copy of the GNU General Public License | |
24 | * along with this program; if not, write to the Free Software | |
25 | * Foundation, Inc., 51 Franklin St, Fifth Floor, Boston, MA 02110-1301 USA | |
26 | * | |
87590e26 KP |
27 | */ |
28 | #ifndef __LINUX_MTD_BBM_H | |
29 | #define __LINUX_MTD_BBM_H | |
30 | ||
31 | /* The maximum number of NAND chips in an array */ | |
32 | #define NAND_MAX_CHIPS 8 | |
33 | ||
34 | /** | |
35 | * struct nand_bbt_descr - bad block table descriptor | |
c62d81bc AR |
36 | * @options: options for this descriptor |
37 | * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE | |
38 | * when bbt is searched, then we store the found bbts pages here. | |
39 | * Its an array and supports up to 8 chips now | |
40 | * @offs: offset of the pattern in the oob area of the page | |
41 | * @veroffs: offset of the bbt version counter in the oob are of the page | |
42 | * @version: version read from the bbt page during scan | |
43 | * @len: length of the pattern, if 0 no pattern check is performed | |
44 | * @maxblocks: maximum number of blocks to search for a bbt. This number of | |
45 | * blocks is reserved at the end of the device where the tables are | |
46 | * written. | |
47 | * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than | |
48 | * bad) block in the stored bbt | |
49 | * @pattern: pattern to identify bad block table or factory marked good / | |
50 | * bad blocks, can be NULL, if len = 0 | |
87590e26 KP |
51 | * |
52 | * Descriptor for the bad block table marker and the descriptor for the | |
53 | * pattern which identifies good and bad blocks. The assumption is made | |
54 | * that the pattern and the version count are always located in the oob area | |
55 | * of the first block. | |
56 | */ | |
57 | struct nand_bbt_descr { | |
58 | int options; | |
59 | int pages[NAND_MAX_CHIPS]; | |
60 | int offs; | |
61 | int veroffs; | |
62 | uint8_t version[NAND_MAX_CHIPS]; | |
63 | int len; | |
64 | int maxblocks; | |
65 | int reserved_block_code; | |
66 | uint8_t *pattern; | |
67 | }; | |
68 | ||
69 | /* Options for the bad block table descriptors */ | |
70 | ||
71 | /* The number of bits used per block in the bbt on the device */ | |
72 | #define NAND_BBT_NRBITS_MSK 0x0000000F | |
73 | #define NAND_BBT_1BIT 0x00000001 | |
74 | #define NAND_BBT_2BIT 0x00000002 | |
75 | #define NAND_BBT_4BIT 0x00000004 | |
76 | #define NAND_BBT_8BIT 0x00000008 | |
77 | /* The bad block table is in the last good block of the device */ | |
78 | #define NAND_BBT_LASTBLOCK 0x00000010 | |
79 | /* The bbt is at the given page, else we must scan for the bbt */ | |
80 | #define NAND_BBT_ABSPAGE 0x00000020 | |
81 | /* The bbt is at the given page, else we must scan for the bbt */ | |
82 | #define NAND_BBT_SEARCH 0x00000040 | |
83 | /* bbt is stored per chip on multichip devices */ | |
84 | #define NAND_BBT_PERCHIP 0x00000080 | |
85 | /* bbt has a version counter at offset veroffs */ | |
86 | #define NAND_BBT_VERSION 0x00000100 | |
453281a9 | 87 | /* Create a bbt if none exists */ |
87590e26 | 88 | #define NAND_BBT_CREATE 0x00000200 |
b8f80684 BN |
89 | /* |
90 | * Create an empty BBT with no vendor information. Vendor's information may be | |
91 | * unavailable, for example, if the NAND controller has a different data and OOB | |
92 | * layout or if this information is already purged. Must be used in conjunction | |
93 | * with NAND_BBT_CREATE. | |
94 | */ | |
b4dc53e1 | 95 | #define NAND_BBT_CREATE_EMPTY 0x00000400 |
87590e26 | 96 | /* Search good / bad pattern through all pages of a block */ |
b4dc53e1 | 97 | #define NAND_BBT_SCANALLPAGES 0x00000800 |
87590e26 | 98 | /* Scan block empty during good / bad block scan */ |
b4dc53e1 | 99 | #define NAND_BBT_SCANEMPTY 0x00001000 |
87590e26 | 100 | /* Write bbt if neccecary */ |
b4dc53e1 | 101 | #define NAND_BBT_WRITE 0x00002000 |
87590e26 | 102 | /* Read and write back block contents when writing bbt */ |
b4dc53e1 | 103 | #define NAND_BBT_SAVECONTENT 0x00004000 |
87590e26 | 104 | /* Search good / bad pattern on the first and the second page */ |
b4dc53e1 | 105 | #define NAND_BBT_SCAN2NDPAGE 0x00008000 |
30fe8115 | 106 | /* Search good / bad pattern on the last page of the eraseblock */ |
b4dc53e1 | 107 | #define NAND_BBT_SCANLASTPAGE 0x00010000 |
a40f7341 BN |
108 | /* |
109 | * Use a flash based bad block table. By default, OOB identifier is saved in | |
110 | * OOB area. This option is passed to the default bad block table function. | |
111 | */ | |
b4dc53e1 | 112 | #define NAND_BBT_USE_FLASH 0x00020000 |
a40f7341 | 113 | /* Do not store flash based bad block table in OOB area; store it in-band */ |
b4dc53e1 BN |
114 | #define NAND_BBT_NO_OOB 0x00040000 |
115 | ||
9eeff824 BN |
116 | /* |
117 | * Flag set by nand_create_default_bbt_descr(), marking that the nand_bbt_descr | |
118 | * was allocated dynamicaly and must be freed in nand_release(). Has no meaning | |
119 | * in nand_chip.bbt_options. | |
120 | */ | |
b4dc53e1 | 121 | #define NAND_BBT_DYNAMICSTRUCT 0x80000000 |
87590e26 KP |
122 | |
123 | /* The maximum number of blocks to scan for a bbt */ | |
124 | #define NAND_BBT_SCAN_MAXBLOCKS 4 | |
125 | ||
126 | /* | |
127 | * Constants for oob configuration | |
128 | */ | |
c62d81bc AR |
129 | #define NAND_SMALL_BADBLOCK_POS 5 |
130 | #define NAND_LARGE_BADBLOCK_POS 0 | |
131 | #define ONENAND_BADBLOCK_POS 0 | |
87590e26 | 132 | |
211ac75f KP |
133 | /* |
134 | * Bad block scanning errors | |
135 | */ | |
136 | #define ONENAND_BBT_READ_ERROR 1 | |
137 | #define ONENAND_BBT_READ_ECC_ERROR 2 | |
138 | #define ONENAND_BBT_READ_FATAL_ERROR 4 | |
139 | ||
87590e26 | 140 | /** |
ea9b6dcc RD |
141 | * struct bbm_info - [GENERIC] Bad Block Table data structure |
142 | * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry | |
143 | * @badblockpos: [INTERN] position of the bad block marker in the oob area | |
144 | * @options: options for this descriptor | |
145 | * @bbt: [INTERN] bad block table pointer | |
146 | * @isbad_bbt: function to determine if a block is bad | |
147 | * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for | |
148 | * initial bad block scan | |
149 | * @priv: [OPTIONAL] pointer to private bbm date | |
87590e26 KP |
150 | */ |
151 | struct bbm_info { | |
152 | int bbt_erase_shift; | |
153 | int badblockpos; | |
154 | int options; | |
155 | ||
156 | uint8_t *bbt; | |
157 | ||
158 | int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt); | |
159 | ||
160 | /* TODO Add more NAND specific fileds */ | |
161 | struct nand_bbt_descr *badblock_pattern; | |
162 | ||
163 | void *priv; | |
164 | }; | |
165 | ||
166 | /* OneNAND BBT interface */ | |
167 | extern int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd); | |
168 | extern int onenand_default_bbt(struct mtd_info *mtd); | |
169 | ||
170 | #endif /* __LINUX_MTD_BBM_H */ |