[MTD] NAND extended commands, badb block table autorefresh

[mirror_ubuntu-zesty-kernel.git] / include / linux / mtd / nand.h

/*
 *  linux/include/linux/mtd/nand.h
 *
 *  Copyright (c) 2000 David Woodhouse <dwmw2@mvhi.com>
 *                     Steven J. Hill <sjhill@realitydiluted.com>
 *                     Thomas Gleixner <tglx@linutronix.de>
 *
 * $Id: nand.h,v 1.69 2005/01/17 18:29:18 dmarlin Exp $
 *
 * This program is free software; you can redistribute it and/or modify
 * it under the terms of the GNU General Public License version 2 as
 * published by the Free Software Foundation.
 *
 *  Info:
 *   Contains standard defines and IDs for NAND flash devices
 *
 *  Changelog:
 *   01-31-2000 DMW     Created
 *   09-18-2000 SJH     Moved structure out of the Disk-On-Chip drivers
 *                      so it can be used by other NAND flash device
 *                      drivers. I also changed the copyright since none
 *                      of the original contents of this file are specific
 *                      to DoC devices. David can whack me with a baseball
 *                      bat later if I did something naughty.
 *   10-11-2000 SJH     Added private NAND flash structure for driver
 *   10-24-2000 SJH     Added prototype for 'nand_scan' function
 *   10-29-2001 TG      changed nand_chip structure to support 
 *                      hardwarespecific function for accessing control lines
 *   02-21-2002 TG      added support for different read/write adress and
 *                      ready/busy line access function
 *   02-26-2002 TG      added chip_delay to nand_chip structure to optimize
 *                      command delay times for different chips
 *   04-28-2002 TG      OOB config defines moved from nand.c to avoid duplicate
 *                      defines in jffs2/wbuf.c
 *   08-07-2002 TG      forced bad block location to byte 5 of OOB, even if
 *                      CONFIG_MTD_NAND_ECC_JFFS2 is not set
 *   08-10-2002 TG      extensions to nand_chip structure to support HW-ECC
 *
 *   08-29-2002 tglx    nand_chip structure: data_poi for selecting 
 *                      internal / fs-driver buffer
 *                      support for 6byte/512byte hardware ECC
 *                      read_ecc, write_ecc extended for different oob-layout
 *                      oob layout selections: NAND_NONE_OOB, NAND_JFFS2_OOB,
 *                      NAND_YAFFS_OOB
 *  11-25-2002 tglx     Added Manufacturer code FUJITSU, NATIONAL
 *                      Split manufacturer and device ID structures 
 *
 *  02-08-2004 tglx     added option field to nand structure for chip anomalities
 *  05-25-2004 tglx     added bad block table support, ST-MICRO manufacturer id
 *                      update of nand_chip structure description
 *  01-17-2005 dmarlin  added extended commands for AG-AND device and added option 
 *                      for BBT_AUTO_REFRESH.
 */
#ifndef __LINUX_MTD_NAND_H
#define __LINUX_MTD_NAND_H

#include <linux/config.h>
#include <linux/wait.h>
#include <linux/spinlock.h>
#include <linux/mtd/mtd.h>

struct mtd_info;
/* Scan and identify a NAND device */
extern int nand_scan (struct mtd_info *mtd, int max_chips);
/* Free resources held by the NAND device */
extern void nand_release (struct mtd_info *mtd);

/* Read raw data from the device without ECC */
extern int nand_read_raw (struct mtd_info *mtd, uint8_t *buf, loff_t from, size_t len, size_t ooblen);


/* The maximum number of NAND chips in an array */
#define NAND_MAX_CHIPS          8

/* This constant declares the max. oobsize / page, which
 * is supported now. If you add a chip with bigger oobsize/page
 * adjust this accordingly.
 */
#define NAND_MAX_OOBSIZE        64

/*
 * Constants for hardware specific CLE/ALE/NCE function
*/
/* Select the chip by setting nCE to low */
#define NAND_CTL_SETNCE         1
/* Deselect the chip by setting nCE to high */
#define NAND_CTL_CLRNCE         2
/* Select the command latch by setting CLE to high */
#define NAND_CTL_SETCLE         3
/* Deselect the command latch by setting CLE to low */
#define NAND_CTL_CLRCLE         4
/* Select the address latch by setting ALE to high */
#define NAND_CTL_SETALE         5
/* Deselect the address latch by setting ALE to low */
#define NAND_CTL_CLRALE         6
/* Set write protection by setting WP to high. Not used! */
#define NAND_CTL_SETWP          7
/* Clear write protection by setting WP to low. Not used! */
#define NAND_CTL_CLRWP          8

/*
 * Standard NAND flash commands
 */
#define NAND_CMD_READ0          0
#define NAND_CMD_READ1          1
#define NAND_CMD_PAGEPROG       0x10
#define NAND_CMD_READOOB        0x50
#define NAND_CMD_ERASE1         0x60
#define NAND_CMD_STATUS         0x70
#define NAND_CMD_STATUS_MULTI   0x71
#define NAND_CMD_SEQIN          0x80
#define NAND_CMD_READID         0x90
#define NAND_CMD_ERASE2         0xd0
#define NAND_CMD_RESET          0xff

/* Extended commands for large page devices */
#define NAND_CMD_READSTART      0x30
#define NAND_CMD_CACHEDPROG     0x15

/* Extended commands for AG-AND device */
/* 
 * Note: the command for NAND_CMD_DEPLETE1 is really 0x00 but 
 *       there is no way to distinguish that from NAND_CMD_READ0
 *       until the remaining sequence of commands has been completed
 *       so add a high order bit and mask it off in the command.
 */
#define NAND_CMD_DEPLETE1       0x100
#define NAND_CMD_DEPLETE2       0x38
#define NAND_CMD_STATUS_MULTI   0x71
#define NAND_CMD_STATUS_ERROR   0x72
/* multi-bank error status (banks 0-3) */
#define NAND_CMD_STATUS_ERROR0  0x73
#define NAND_CMD_STATUS_ERROR1  0x74
#define NAND_CMD_STATUS_ERROR2  0x75
#define NAND_CMD_STATUS_ERROR3  0x76
#define NAND_CMD_STATUS_RESET   0x7f
#define NAND_CMD_STATUS_CLEAR   0xff

/* Status bits */
#define NAND_STATUS_FAIL        0x01
#define NAND_STATUS_FAIL_N1     0x02
#define NAND_STATUS_TRUE_READY  0x20
#define NAND_STATUS_READY       0x40
#define NAND_STATUS_WP          0x80

/* 
 * Constants for ECC_MODES
 */

/* No ECC. Usage is not recommended ! */
#define NAND_ECC_NONE           0
/* Software ECC 3 byte ECC per 256 Byte data */
#define NAND_ECC_SOFT           1
/* Hardware ECC 3 byte ECC per 256 Byte data */
#define NAND_ECC_HW3_256        2
/* Hardware ECC 3 byte ECC per 512 Byte data */
#define NAND_ECC_HW3_512        3
/* Hardware ECC 3 byte ECC per 512 Byte data */
#define NAND_ECC_HW6_512        4
/* Hardware ECC 8 byte ECC per 512 Byte data */
#define NAND_ECC_HW8_512        6
/* Hardware ECC 12 byte ECC per 2048 Byte data */
#define NAND_ECC_HW12_2048      7

/*
 * Constants for Hardware ECC
*/
/* Reset Hardware ECC for read */
#define NAND_ECC_READ           0
/* Reset Hardware ECC for write */
#define NAND_ECC_WRITE          1
/* Enable Hardware ECC before syndrom is read back from flash */
#define NAND_ECC_READSYN        2

/* Option constants for bizarre disfunctionality and real
*  features
*/
/* Chip can not auto increment pages */
#define NAND_NO_AUTOINCR        0x00000001
/* Buswitdh is 16 bit */
#define NAND_BUSWIDTH_16        0x00000002
/* Device supports partial programming without padding */
#define NAND_NO_PADDING         0x00000004
/* Chip has cache program function */
#define NAND_CACHEPRG           0x00000008
/* Chip has copy back function */
#define NAND_COPYBACK           0x00000010
/* AND Chip which has 4 banks and a confusing page / block 
 * assignment. See Renesas datasheet for further information */
#define NAND_IS_AND             0x00000020
/* Chip has a array of 4 pages which can be read without
 * additional ready /busy waits */
#define NAND_4PAGE_ARRAY        0x00000040 
/* Chip requires that BBT is periodically rewritten to prevent
 * bits from adjacent blocks from 'leaking' in altering data.
 * This happens with the Renesas AG-AND chips, possibly others.  */
#define BBT_AUTO_REFRESH        0x00000080

/* Options valid for Samsung large page devices */
#define NAND_SAMSUNG_LP_OPTIONS \
        (NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK)

/* Macros to identify the above */
#define NAND_CANAUTOINCR(chip) (!(chip->options & NAND_NO_AUTOINCR))
#define NAND_MUST_PAD(chip) (!(chip->options & NAND_NO_PADDING))
#define NAND_HAS_CACHEPROG(chip) ((chip->options & NAND_CACHEPRG))
#define NAND_HAS_COPYBACK(chip) ((chip->options & NAND_COPYBACK))

/* Mask to zero out the chip options, which come from the id table */
#define NAND_CHIPOPTIONS_MSK    (0x0000ffff & ~NAND_NO_AUTOINCR)

/* Non chip related options */
/* Use a flash based bad block table. This option is passed to the
 * default bad block table function. */
#define NAND_USE_FLASH_BBT      0x00010000
/* The hw ecc generator provides a syndrome instead a ecc value on read 
 * This can only work if we have the ecc bytes directly behind the 
 * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */
#define NAND_HWECC_SYNDROME     0x00020000


/* Options set by nand scan */
/* Nand scan has allocated oob_buf */
#define NAND_OOBBUF_ALLOC       0x40000000
/* Nand scan has allocated data_buf */
#define NAND_DATABUF_ALLOC      0x80000000


/*
 * nand_state_t - chip states
 * Enumeration for NAND flash chip state
 */
typedef enum {
        FL_READY,
        FL_READING,
        FL_WRITING,
        FL_ERASING,
        FL_SYNCING,
        FL_CACHEDPRG,
} nand_state_t;

/* Keep gcc happy */
struct nand_chip;

/**
 * struct nand_hw_control - Control structure for hardware controller (e.g ECC generator) shared among independend devices
 * @lock:               protection lock  
 * @active:             the mtd device which holds the controller currently
 */
struct nand_hw_control {
        spinlock_t       lock;
        struct nand_chip *active;
};

/**
 * struct nand_chip - NAND Private Flash Chip Data
 * @IO_ADDR_R:          [BOARDSPECIFIC] address to read the 8 I/O lines of the flash device 
 * @IO_ADDR_W:          [BOARDSPECIFIC] address to write the 8 I/O lines of the flash device 
 * @read_byte:          [REPLACEABLE] read one byte from the chip
 * @write_byte:         [REPLACEABLE] write one byte to the chip
 * @read_word:          [REPLACEABLE] read one word from the chip
 * @write_word:         [REPLACEABLE] write one word to the chip
 * @write_buf:          [REPLACEABLE] write data from the buffer to the chip
 * @read_buf:           [REPLACEABLE] read data from the chip into the buffer
 * @verify_buf:         [REPLACEABLE] verify buffer contents against the chip data
 * @select_chip:        [REPLACEABLE] select chip nr
 * @block_bad:          [REPLACEABLE] check, if the block is bad
 * @block_markbad:      [REPLACEABLE] mark the block bad
 * @hwcontrol:          [BOARDSPECIFIC] hardwarespecific function for accesing control-lines
 * @dev_ready:          [BOARDSPECIFIC] hardwarespecific function for accesing device ready/busy line
 *                      If set to NULL no access to ready/busy is available and the ready/busy information
 *                      is read from the chip status register
 * @cmdfunc:            [REPLACEABLE] hardwarespecific function for writing commands to the chip
 * @waitfunc:           [REPLACEABLE] hardwarespecific function for wait on ready
 * @calculate_ecc:      [REPLACEABLE] function for ecc calculation or readback from ecc hardware
 * @correct_data:       [REPLACEABLE] function for ecc correction, matching to ecc generator (sw/hw)
 * @enable_hwecc:       [BOARDSPECIFIC] function to enable (reset) hardware ecc generator. Must only
 *                      be provided if a hardware ECC is available
 * @erase_cmd:          [INTERN] erase command write function, selectable due to AND support
 * @scan_bbt:           [REPLACEABLE] function to scan bad block table
 * @eccmode:            [BOARDSPECIFIC] mode of ecc, see defines 
 * @eccsize:            [INTERN] databytes used per ecc-calculation
 * @eccbytes:           [INTERN] number of ecc bytes per ecc-calculation step
 * @eccsteps:           [INTERN] number of ecc calculation steps per page
 * @chip_delay:         [BOARDSPECIFIC] chip dependent delay for transfering data from array to read regs (tR)
 * @chip_lock:          [INTERN] spinlock used to protect access to this structure and the chip
 * @wq:                 [INTERN] wait queue to sleep on if a NAND operation is in progress
 * @state:              [INTERN] the current state of the NAND device
 * @page_shift:         [INTERN] number of address bits in a page (column address bits)
 * @phys_erase_shift:   [INTERN] number of address bits in a physical eraseblock
 * @bbt_erase_shift:    [INTERN] number of address bits in a bbt entry
 * @chip_shift:         [INTERN] number of address bits in one chip
 * @data_buf:           [INTERN] internal buffer for one page + oob 
 * @oob_buf:            [INTERN] oob buffer for one eraseblock
 * @oobdirty:           [INTERN] indicates that oob_buf must be reinitialized
 * @data_poi:           [INTERN] pointer to a data buffer
 * @options:            [BOARDSPECIFIC] various chip options. They can partly be set to inform nand_scan about
 *                      special functionality. See the defines for further explanation
 * @badblockpos:        [INTERN] position of the bad block marker in the oob area
 * @numchips:           [INTERN] number of physical chips
 * @chipsize:           [INTERN] the size of one chip for multichip arrays
 * @pagemask:           [INTERN] page number mask = number of (pages / chip) - 1
 * @pagebuf:            [INTERN] holds the pagenumber which is currently in data_buf
 * @autooob:            [REPLACEABLE] the default (auto)placement scheme
 * @bbt:                [INTERN] bad block table pointer
 * @bbt_td:             [REPLACEABLE] bad block table descriptor for flash lookup
 * @bbt_md:             [REPLACEABLE] bad block table mirror descriptor
 * @badblock_pattern:   [REPLACEABLE] bad block scan pattern used for initial bad block scan 
 * @controller:         [OPTIONAL] a pointer to a hardware controller structure which is shared among multiple independend devices
 * @priv:               [OPTIONAL] pointer to private chip date
 */
 
struct nand_chip {
        void  __iomem   *IO_ADDR_R;
        void  __iomem   *IO_ADDR_W;
        
        u_char          (*read_byte)(struct mtd_info *mtd);
        void            (*write_byte)(struct mtd_info *mtd, u_char byte);
        u16             (*read_word)(struct mtd_info *mtd);
        void            (*write_word)(struct mtd_info *mtd, u16 word);
        
        void            (*write_buf)(struct mtd_info *mtd, const u_char *buf, int len);
        void            (*read_buf)(struct mtd_info *mtd, u_char *buf, int len);
        int             (*verify_buf)(struct mtd_info *mtd, const u_char *buf, int len);
        void            (*select_chip)(struct mtd_info *mtd, int chip);
        int             (*block_bad)(struct mtd_info *mtd, loff_t ofs, int getchip);
        int             (*block_markbad)(struct mtd_info *mtd, loff_t ofs);
        void            (*hwcontrol)(struct mtd_info *mtd, int cmd);
        int             (*dev_ready)(struct mtd_info *mtd);
        void            (*cmdfunc)(struct mtd_info *mtd, unsigned command, int column, int page_addr);
        int             (*waitfunc)(struct mtd_info *mtd, struct nand_chip *this, int state);
        int             (*calculate_ecc)(struct mtd_info *mtd, const u_char *dat, u_char *ecc_code);
        int             (*correct_data)(struct mtd_info *mtd, u_char *dat, u_char *read_ecc, u_char *calc_ecc);
        void            (*enable_hwecc)(struct mtd_info *mtd, int mode);
        void            (*erase_cmd)(struct mtd_info *mtd, int page);
        int             (*scan_bbt)(struct mtd_info *mtd);
        int             eccmode;
        int             eccsize;
        int             eccbytes;
        int             eccsteps;
        int             chip_delay;
        spinlock_t      chip_lock;
        wait_queue_head_t wq;
        nand_state_t    state;
        int             page_shift;
        int             phys_erase_shift;
        int             bbt_erase_shift;
        int             chip_shift;
        u_char          *data_buf;
        u_char          *oob_buf;
        int             oobdirty;
        u_char          *data_poi;
        unsigned int    options;
        int             badblockpos;
        int             numchips;
        unsigned long   chipsize;
        int             pagemask;
        int             pagebuf;
        struct nand_oobinfo     *autooob;
        uint8_t         *bbt;
        struct nand_bbt_descr   *bbt_td;
        struct nand_bbt_descr   *bbt_md;
        struct nand_bbt_descr   *badblock_pattern;
        struct nand_hw_control  *controller;
        void            *priv;
};

/*
 * NAND Flash Manufacturer ID Codes
 */
#define NAND_MFR_TOSHIBA        0x98
#define NAND_MFR_SAMSUNG        0xec
#define NAND_MFR_FUJITSU        0x04
#define NAND_MFR_NATIONAL       0x8f
#define NAND_MFR_RENESAS        0x07
#define NAND_MFR_STMICRO        0x20

/**
 * struct nand_flash_dev - NAND Flash Device ID Structure
 *
 * @name:       Identify the device type
 * @id:         device ID code
 * @pagesize:   Pagesize in bytes. Either 256 or 512 or 0
 *              If the pagesize is 0, then the real pagesize 
 *              and the eraseize are determined from the
 *              extended id bytes in the chip
 * @erasesize:  Size of an erase block in the flash device.
 * @chipsize:   Total chipsize in Mega Bytes
 * @options:    Bitfield to store chip relevant options
 */
struct nand_flash_dev {
        char *name;
        int id;
        unsigned long pagesize;
        unsigned long chipsize;
        unsigned long erasesize;
        unsigned long options;
};

/**
 * struct nand_manufacturers - NAND Flash Manufacturer ID Structure
 * @name:       Manufacturer name
 * @id:         manufacturer ID code of device.
*/
struct nand_manufacturers {
        int id;
        char * name;
};

extern struct nand_flash_dev nand_flash_ids[];
extern struct nand_manufacturers nand_manuf_ids[];

/** 
 * struct nand_bbt_descr - bad block table descriptor
 * @options:    options for this descriptor
 * @pages:      the page(s) where we find the bbt, used with option BBT_ABSPAGE
 *              when bbt is searched, then we store the found bbts pages here.
 *              Its an array and supports up to 8 chips now
 * @offs:       offset of the pattern in the oob area of the page
 * @veroffs:    offset of the bbt version counter in the oob are of the page
 * @version:    version read from the bbt page during scan
 * @len:        length of the pattern, if 0 no pattern check is performed
 * @maxblocks:  maximum number of blocks to search for a bbt. This number of
 *              blocks is reserved at the end of the device where the tables are 
 *              written.
 * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
 *              bad) block in the stored bbt
 * @pattern:    pattern to identify bad block table or factory marked good / 
 *              bad blocks, can be NULL, if len = 0
 *
 * Descriptor for the bad block table marker and the descriptor for the 
 * pattern which identifies good and bad blocks. The assumption is made
 * that the pattern and the version count are always located in the oob area
 * of the first block.
 */
struct nand_bbt_descr {
        int     options;
        int     pages[NAND_MAX_CHIPS];
        int     offs;
        int     veroffs;
        uint8_t version[NAND_MAX_CHIPS];
        int     len;
        int     maxblocks;
        int     reserved_block_code;
        uint8_t *pattern;
};

/* Options for the bad block table descriptors */

/* The number of bits used per block in the bbt on the device */
#define NAND_BBT_NRBITS_MSK     0x0000000F
#define NAND_BBT_1BIT           0x00000001
#define NAND_BBT_2BIT           0x00000002
#define NAND_BBT_4BIT           0x00000004
#define NAND_BBT_8BIT           0x00000008
/* The bad block table is in the last good block of the device */
#define NAND_BBT_LASTBLOCK      0x00000010
/* The bbt is at the given page, else we must scan for the bbt */
#define NAND_BBT_ABSPAGE        0x00000020
/* The bbt is at the given page, else we must scan for the bbt */
#define NAND_BBT_SEARCH         0x00000040
/* bbt is stored per chip on multichip devices */
#define NAND_BBT_PERCHIP        0x00000080
/* bbt has a version counter at offset veroffs */
#define NAND_BBT_VERSION        0x00000100
/* Create a bbt if none axists */
#define NAND_BBT_CREATE         0x00000200
/* Search good / bad pattern through all pages of a block */
#define NAND_BBT_SCANALLPAGES   0x00000400
/* Scan block empty during good / bad block scan */
#define NAND_BBT_SCANEMPTY      0x00000800
/* Write bbt if neccecary */
#define NAND_BBT_WRITE          0x00001000
/* Read and write back block contents when writing bbt */
#define NAND_BBT_SAVECONTENT    0x00002000
/* Search good / bad pattern on the first and the second page */
#define NAND_BBT_SCAN2NDPAGE    0x00004000

/* The maximum number of blocks to scan for a bbt */
#define NAND_BBT_SCAN_MAXBLOCKS 4

extern int nand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd);
extern int nand_update_bbt (struct mtd_info *mtd, loff_t offs);
extern int nand_default_bbt (struct mtd_info *mtd);
extern int nand_isbad_bbt (struct mtd_info *mtd, loff_t offs, int allowbbt);
extern int nand_erase_nand (struct mtd_info *mtd, struct erase_info *instr, int allowbbt);

/*
* Constants for oob configuration
*/
#define NAND_SMALL_BADBLOCK_POS         5
#define NAND_LARGE_BADBLOCK_POS         0

#endif /* __LINUX_MTD_NAND_H */