--- /dev/null
+/* SPDX-License-Identifier: BSD-3-Clause
+ * Copyright(c) 2020 Intel Corporation
+ */
+
+#include "test_ring_stress.h"
+
+static int
+run_test(const struct test *test)
+{
+ int32_t rc;
+ uint32_t i, k;
+
+ for (i = 0, k = 0; i != test->nb_case; i++) {
+
+ printf("TEST-CASE %s %s START\n",
+ test->name, test->cases[i].name);
+
+ rc = test->cases[i].func(test->cases[i].wfunc);
+ k += (rc == 0);
+
+ if (rc != 0)
+ printf("TEST-CASE %s %s FAILED\n",
+ test->name, test->cases[i].name);
+ else
+ printf("TEST-CASE %s %s OK\n",
+ test->name, test->cases[i].name);
+ }
+
+ return k;
+}
+
+static int
+test_ring_stress(void)
+{
+ uint32_t n, k;
+
+ n = 0;
+ k = 0;
+
+ n += test_ring_mpmc_stress.nb_case;
+ k += run_test(&test_ring_mpmc_stress);
+
+ n += test_ring_rts_stress.nb_case;
+ k += run_test(&test_ring_rts_stress);
+
+ n += test_ring_hts_stress.nb_case;
+ k += run_test(&test_ring_hts_stress);
+
+ n += test_ring_peek_stress.nb_case;
+ k += run_test(&test_ring_peek_stress);
+
+ printf("Number of tests:\t%u\nSuccess:\t%u\nFailed:\t%u\n",
+ n, k, n - k);
+ return (k != n);
+}
+
+REGISTER_TEST_COMMAND(ring_stress_autotest, test_ring_stress);